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The memory test system provides an environment optimized for DRAM and NAND flash testing through efficient resource management and high-speed data processing.

The semiconductor evaluation solution analyzes and evaluates the characteristics of DRAM, NAND Flash and other semiconductor memories in a user-friendly environment.
It is an optimal solution for R&D as it can analyze test result data at high speed in an independent test environment.

We provide next-generation semiconductor memory test solutions by improving the performance of test systems.

These are solutions that increases the number of channels or extend the voltage or current range of a test system's power supply.
These solutions can increase the power supply’s current range, measure current consumption, and improve load transient response characteristics.